Home - Products - Measurement & Analyzer Instrument - Automatic fluorescence spectrum analyzer KS-MAI-FS30
It can also meet the micro-area RoHS detection and multi-element composition analysis, advanced algorithms and spectrum analysis.It is widely used in the quality control of various products, incoming material inspection and the measurement of production process control.
Technical Parameters
The FS series fluorescence spectrometer is an all-element up-illuminated spectrometer, which can measure the film thickness of nanometer-level thickness, tiny samples and groove shaped parts. It can also meet the micro-area RoHS detection and multi-element composition analysis, advanced algorithms and spectrum analysis.It is widely used in the quality control of various products, incoming material inspection and the measurement of production process control. Technology has solved many industry problems. Performance advantages: 1. Small sample detection: the minimum measurement area is 0.0085mm² 2. The zoom device algorithm: the measurement distance can be changed
Technical Parameters:
| Model | KS-MAI-FS30 |
| Scope of composition analysis | Aluminum (Al)-Uranium (U) |
| The lowest detection limit of ingredients | 1ppm |
| Coating analysis range | lithium (Li)-uranium (U) |
| The lowest detection limit of coating | 0.005μm |
| Minimum measuring diameter | 0.1*0.3mm (minimum measuring area 0.03mm²) |
| Standard configuration | minimum measuring diameter 0.3mm (minimum measuring area 0.07mm²) |
| Focus distance | 0-30mm |
| Sample cavity size | 530mm*570mm*150mm |
| Instrument size | 550mm*760mm*635mm |
| Instrument weight | 100KG |
| XY axis table movement range | 100mm*150mm |
| Maximum load-bearing capacity of XY axis worktable | 15KG |
